SPM | AFM | Scanning Probe Microscope| Atomic Force Microscope

1. 1. Integrated scanning-probe and sample-stage enhances the anti-interference ability of the spring suspension system.
2. Precision laser and probe positioning device makes probe changing and spot adjusting simple and convenient.
3. The sample-to-probe auto-approaching provides an efficient way to prevent cantilever crash.
4. The vertical sample probe approaching allows achieving precise positioning of area of interest.
5. Sample scanning area of interest may be freely selected with an high-precision/wide-range XY table.
6. Top-view CCD system warrants real-time observation and positioning of the probe on the selected sample region.
7. Modular design of electronic control system facilitates maintenance and continuous improvements.
8. The compact model 2000 may be easily transported inside an aluminum luggage.
9. The hermetic box in model 1000 provides a controlled environment